This paper describes the deployment and optimization process of triple-module redundancy
(TMR) under high design constraints against single-event upset (SEU) and single-event
transient (SET). It includes modelling of single-event effect (SEE) pulses with TCAD mesh
model, TMR deployment strategies, and verification methods. The simulation result shows
that the prototype system with optimized TMR deployment has high reliability with respect
to design requirements. The system can run for more than 5 years without critical errors
with an equivalent error rate in the working environment is lower than 10$^{-9}$ .
Volume 370 -
Topical Workshop on Electronics for Particle Physics (TWEPP2019) -
Radiation Tolerant Components and Systems
Triple-Modular Redundancy Deployment Optimization in the Sensor Readout System of the CBM Micro Vertex Detector
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Pre-published on:
March 06, 2020
Published on:
April 21, 2020
Abstract
DOI: https://doi.org/10.22323/1.370.0131
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Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.