Microwave Imaging Reflectometry On Diii-D
B. Tobias*, G. Kramer, E.J. Valeo, C.M. Muscatello, X. Ren, M. Chen, A.G. Spear, A.V. Pham, T. Phan, M.A. Mamidanna, J. Lai, M. Li, D. Fu, F. Hu, C. Domier, N. Luhmann Jr., S. Zemedkun, T. Munsat and Y. Zhu
Published on:
October 26, 2016
DOI: https://doi.org/10.22323/1.240.0004
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